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Sensors 2016, 16(3), 319; doi:10.3390/s16030319

Signal-Conditioning Block of a 1 × 200 CMOS Detector Array for a Terahertz Real-Time Imaging System

1
Converged Medical Device Research Center, Korea Electrotechnology Research Institute (KERI), Ansan-si, Gyeonggi-do 15588, Korea
2
Electric Propulsion Research Center, KERI, Changwon-si, Gyeongsangnam-do 51543, Korea
*
Author to whom correspondence should be addressed.
Academic Editors: Vincenzo Spagnolo and Dragan Indjin
Received: 21 December 2015 / Revised: 22 February 2016 / Accepted: 25 February 2016 / Published: 2 March 2016
(This article belongs to the Special Issue Infrared and THz Sensing and Imaging)
View Full-Text   |   Download PDF [4644 KB, uploaded 2 March 2016]   |  

Abstract

A signal conditioning block of a 1 × 200 Complementary Metal-Oxide-Semiconductor (CMOS) detector array is proposed to be employed with a real-time 0.2 THz imaging system for inspecting large areas. The plasmonic CMOS detector array whose pixel size including an integrated antenna is comparable to the wavelength of the THz wave for the imaging system, inevitably carries wide pixel-to-pixel variation. To make the variant outputs from the array uniform, the proposed signal conditioning block calibrates the responsivity of each pixel by controlling the gate bias of each detector and the voltage gain of the lock-in amplifiers in the block. The gate bias of each detector is modulated to 1 MHz to improve the signal-to-noise ratio of the imaging system via the electrical modulation by the conditioning block. In addition, direct current (DC) offsets of the detectors in the array are cancelled by initializing the output voltage level from the block. Real-time imaging using the proposed signal conditioning block is demonstrated by obtaining images at the rate of 19.2 frame-per-sec of an object moving on the conveyor belt with a scan width of 20 cm and a scan speed of 25 cm/s. View Full-Text
Keywords: THz system; CMOS detector array; real-time imaging; plasmon detector; electrical modulation; responsivity calibration; DC offset cancellation; signal conditioning block THz system; CMOS detector array; real-time imaging; plasmon detector; electrical modulation; responsivity calibration; DC offset cancellation; signal conditioning block
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Yang, J.-R.; Lee, W.-J.; Han, S.-T. Signal-Conditioning Block of a 1 × 200 CMOS Detector Array for a Terahertz Real-Time Imaging System. Sensors 2016, 16, 319.

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