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Sensors 2016, 16(12), 2020; doi:10.3390/s16122020

Three-Dimensional Continuous Displacement Measurement with Temporal Speckle Pattern Interferometry

Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China
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Author to whom correspondence should be addressed.
Academic Editor: Vittorio M. N. Passaro
Received: 18 September 2016 / Revised: 24 November 2016 / Accepted: 24 November 2016 / Published: 29 November 2016
(This article belongs to the Section Physical Sensors)
View Full-Text   |   Download PDF [8487 KB, uploaded 1 December 2016]   |  

Abstract

A speckle interferometer which can measure whole field three-dimensional displacements continuously and dynamically has been built. Three different wavelength lasers are used to produce the speckle interferograms of the two in-plane displacements (displacements in the x- and y-direction) and one out-of-plane displacement (displacement in the z-direction), respectively. One color CCD camera is employed to collect these mixed speckle interferograms simultaneously. The mixed interferograms are separated by the Red, Green and Blue channels of the color CCD camera, and then are processed by the wavelet transform technique to extract the phase information of the measured object. The preliminary experiment is carried out to demonstrate the performance of this new device. View Full-Text
Keywords: displacement sensor; three-dimensional measurement; temporal spackle pattern interferometry; wavelet transform displacement sensor; three-dimensional measurement; temporal spackle pattern interferometry; wavelet transform
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Qin, J.; Gao, Z.; Wang, X.; Yang, S. Three-Dimensional Continuous Displacement Measurement with Temporal Speckle Pattern Interferometry. Sensors 2016, 16, 2020.

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