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Sensors 2015, 15(10), 25123-25138; doi:10.3390/s151025123

Double Laser for Depth Measurement of Thin Films of Ice

Centro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, Spain
Author to whom correspondence should be addressed.
Academic Editor: Markus Sigrist
Received: 22 July 2015 / Revised: 16 September 2015 / Accepted: 19 September 2015 / Published: 29 September 2015
(This article belongs to the Section Physical Sensors)
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The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we can also measure the refractive index of the thin film material exactly under the same experimental conditions. We have also obtained interesting results with regard to structural changes in the solid substance with changing temperature and have observed the corresponding behavior of mixtures of substances. View Full-Text
Keywords: thin films; thickness; refractive index thin films; thickness; refractive index

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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Beltrán, M.D.; Molina, R.L.; Aznar, M.Á.S.; Moltó, C.S.; Verdú, C.M. Double Laser for Depth Measurement of Thin Films of Ice. Sensors 2015, 15, 25123-25138.

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