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Reset Tree-Based Optical Fault Detection
Computer Engineering Department, Pusan National University, Busan 609-735, Korea
Electronic and Telecommunications Research Institute (ETRI), Daejeon 305-700, Korea
The Attached Institute of ETRI, Daejeon 305-811, Korea
* Author to whom correspondence should be addressed.
Received: 9 April 2013; in revised form: 12 May 2013 / Accepted: 13 May 2013 / Published: 21 May 2013
Abstract: In this paper, we present a new reset tree-based scheme to protect cryptographic hardware against optical fault injection attacks. As one of the most powerful invasive attacks on cryptographic hardware, optical fault attacks cause semiconductors to misbehave by injecting high-energy light into a decapped integrated circuit. The contaminated result from the affected chip is then used to reveal secret information, such as a key, from the cryptographic hardware. Since the advent of such attacks, various countermeasures have been proposed. Although most of these countermeasures are strong, there is still the possibility of attack. In this paper, we present a novel optical fault detection scheme that utilizes the buffers on a circuit’s reset signal tree as a fault detection sensor. To evaluate our proposal, we model radiation-induced currents into circuit components and perform a SPICE simulation. The proposed scheme is expected to be used as a supplemental security tool.
Keywords: optical fault; single event transient; soft-error; reset tree; fault detection
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MDPI and ACS Style
Lee, D.-G.; Choi, D.; Seo, J.; Kim, H. Reset Tree-Based Optical Fault Detection. Sensors 2013, 13, 6713-6729.
Lee D-G, Choi D, Seo J, Kim H. Reset Tree-Based Optical Fault Detection. Sensors. 2013; 13(5):6713-6729.
Lee, Dong-Geon; Choi, Dooho; Seo, Jungtaek; Kim, Howon. 2013. "Reset Tree-Based Optical Fault Detection." Sensors 13, no. 5: 6713-6729.