Open AccessThis article is
- freely available
Optical Triangulation-Based Microtopographic Inspection of Surfaces
Centro de Física, Universidade do Minho, Campus de Gualtar, Braga 4710-057, Portugal
Received: 21 February 2012; in revised form: 22 March 2012 / Accepted: 28 March 2012 / Published: 29 March 2012
Abstract: The non-invasive inspection of surfaces is a major issue in a wide variety of industries and research laboratories. The vast and increasing range of surface types, tolerance requirements and measurement constraints demanded during the last decades represents a major research effort in the development of new methods, systems and metrological strategies. The discreet dimensional evaluation the rugometric characterization and the profilometric inspection seem to be insufficient in many instances. The full microtopographic inspection has became a common requirement. Among the different systems developed, optical methods have the most important role and among those triangulation-based ones have gained a major status thanks to their flexibility, reliability and robustness. In this communication we will provide a brief historical review on the development of optical triangulation application to the dimensional inspection of objects and surfaces and on the work done at the Microtopography Laboratory of the Physics Department of the University of Minho, Portugal, in the development of methods and systems of optical triangulation-based microtopographic inspection of surfaces.
Keywords: microtopography; optical triangulation; non-invasive inspection; rugometry
Article StatisticsClick here to load and display the download statistics.
Notes: Multiple requests from the same IP address are counted as one view.
Cite This Article
MDPI and ACS Style
Costa, M.F.M. Optical Triangulation-Based Microtopographic Inspection of Surfaces. Sensors 2012, 12, 4399-4420.
Costa MFM. Optical Triangulation-Based Microtopographic Inspection of Surfaces. Sensors. 2012; 12(4):4399-4420.
Costa, Manuel F. M. 2012. "Optical Triangulation-Based Microtopographic Inspection of Surfaces." Sensors 12, no. 4: 4399-4420.