Roosjen, P.P.J.; Clevers, J.G.P.W.; Bartholomeus, H.M.; Schaepman, M.E.; Schaepman-Strub, G.; Jalink, H.; Van der Schoor, R.; De Jong, A.
A Laboratory Goniometer System for Measuring Reflectance and Emittance Anisotropy. Sensors 2012, 12, 17358-17371.
https://doi.org/10.3390/s121217358
AMA Style
Roosjen PPJ, Clevers JGPW, Bartholomeus HM, Schaepman ME, Schaepman-Strub G, Jalink H, Van der Schoor R, De Jong A.
A Laboratory Goniometer System for Measuring Reflectance and Emittance Anisotropy. Sensors. 2012; 12(12):17358-17371.
https://doi.org/10.3390/s121217358
Chicago/Turabian Style
Roosjen, Peter P. J., Jan G. P. W. Clevers, Harm M. Bartholomeus, Michael E. Schaepman, Gabriela Schaepman-Strub, Henk Jalink, Rob Van der Schoor, and Arjan De Jong.
2012. "A Laboratory Goniometer System for Measuring Reflectance and Emittance Anisotropy" Sensors 12, no. 12: 17358-17371.
https://doi.org/10.3390/s121217358
APA Style
Roosjen, P. P. J., Clevers, J. G. P. W., Bartholomeus, H. M., Schaepman, M. E., Schaepman-Strub, G., Jalink, H., Van der Schoor, R., & De Jong, A.
(2012). A Laboratory Goniometer System for Measuring Reflectance and Emittance Anisotropy. Sensors, 12(12), 17358-17371.
https://doi.org/10.3390/s121217358
