Next Article in Journal
Spectral Identification of Lighting Type and Character
Next Article in Special Issue
Phototactic and Chemotactic Signal Transduction by Transmembrane Receptors and Transducers in Microorganisms
Previous Article in Journal
A Monitoring and Advisory System for Diabetes Patient Management Using a Rule-Based Method and KNN
Previous Article in Special Issue
Carbon Nanotube Integration with a CMOS Process
Sensors 2010, 10(4), 3954-3960; doi:10.3390/s100403954
Article

Greatly Improved Small Inductance Measurement Using Quartz Crystal Parasitic Capacitance Compensation

*  and
Received: 3 February 2010; in revised form: 23 March 2010 / Accepted: 23 March 2010 / Published: 20 April 2010
(This article belongs to the Special Issue Advances in Transducers)
View Full-Text   |   Download PDF [145 KB, uploaded 21 June 2014]   |   Browse Figures
Abstract: Generally, quartz crystal inductance frequency pulling in oscillators is very low and therefore is not often used in practice. The new method of improving frequencypullability uses inductance to compensate for quartz stray capacitances. To this end, a special AT fundamental quartz crystal working near the antiresonance frequency is selected. By modifying its equivalent circuit with load inductance and series tuning capacitance, the magnetic sensing of the circuit can be highly improved. The experimental results show that the new approach using the quartz crystal stray capacitance compensation method increases the frequency pulling range (from ≅ 2 kHz/mH to ≅ 600 kHz/mH) by × 300 depending on the type of oscillator, making possible the measurement of nano-magnetic changes.
Keywords: quartz crystal; magnetic pulling; parasitic capacitance compensation quartz crystal; magnetic pulling; parasitic capacitance compensation
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Export to BibTeX |
EndNote


MDPI and ACS Style

Matko, V.; Jezernik, K. Greatly Improved Small Inductance Measurement Using Quartz Crystal Parasitic Capacitance Compensation. Sensors 2010, 10, 3954-3960.

AMA Style

Matko V, Jezernik K. Greatly Improved Small Inductance Measurement Using Quartz Crystal Parasitic Capacitance Compensation. Sensors. 2010; 10(4):3954-3960.

Chicago/Turabian Style

Matko, Vojko; Jezernik, Karel. 2010. "Greatly Improved Small Inductance Measurement Using Quartz Crystal Parasitic Capacitance Compensation." Sensors 10, no. 4: 3954-3960.


Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert