Sensors 2010, 10(4), 3954-3960; doi:10.3390/s100403954
Article

Greatly Improved Small Inductance Measurement Using Quartz Crystal Parasitic Capacitance Compensation

Received: 3 February 2010; in revised form: 23 March 2010 / Accepted: 23 March 2010 / Published: 20 April 2010
(This article belongs to the Special Issue Advances in Transducers)
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract: Generally, quartz crystal inductance frequency pulling in oscillators is very low and therefore is not often used in practice. The new method of improving frequencypullability uses inductance to compensate for quartz stray capacitances. To this end, a special AT fundamental quartz crystal working near the antiresonance frequency is selected. By modifying its equivalent circuit with load inductance and series tuning capacitance, the magnetic sensing of the circuit can be highly improved. The experimental results show that the new approach using the quartz crystal stray capacitance compensation method increases the frequency pulling range (from ≅ 2 kHz/mH to ≅ 600 kHz/mH) by × 300 depending on the type of oscillator, making possible the measurement of nano-magnetic changes.
Keywords: quartz crystal; magnetic pulling; parasitic capacitance compensation
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MDPI and ACS Style

Matko, V.; Jezernik, K. Greatly Improved Small Inductance Measurement Using Quartz Crystal Parasitic Capacitance Compensation. Sensors 2010, 10, 3954-3960.

AMA Style

Matko V, Jezernik K. Greatly Improved Small Inductance Measurement Using Quartz Crystal Parasitic Capacitance Compensation. Sensors. 2010; 10(4):3954-3960.

Chicago/Turabian Style

Matko, Vojko; Jezernik, Karel. 2010. "Greatly Improved Small Inductance Measurement Using Quartz Crystal Parasitic Capacitance Compensation." Sensors 10, no. 4: 3954-3960.

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