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A Compact Vertical Scanner for Atomic Force Microscopes
AbstractA compact vertical scanner for an atomic force microscope (AFM) is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the scanner’s performance, experiments are performed to evaluate the travel range, resonance frequency, and feedback noise level. In addition, an AFM image using the proposed vertical scanner is generated.
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Park, J.H.; Shim, J.; Lee, D.-Y. A Compact Vertical Scanner for Atomic Force Microscopes. Sensors 2010, 10, 10673-10682.View more citation formats
Park JH, Shim J, Lee D-Y. A Compact Vertical Scanner for Atomic Force Microscopes. Sensors. 2010; 10(12):10673-10682.Chicago/Turabian Style
Park, Jae Hong; Shim, Jaesool; Lee, Dong-Yeon. 2010. "A Compact Vertical Scanner for Atomic Force Microscopes." Sensors 10, no. 12: 10673-10682.