Entropy 2014, 16(1), 582-606; doi:10.3390/e16010582

Two-Atom Collisions and the Loading of Atoms in Microtraps

1 Jack Dodd Centre for Quantum Technology, Department of Physics, University of Otago, Dunedin 9016, New Zealand 2 Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200, Thailand
* Author to whom correspondence should be addressed.
Received: 18 November 2013; in revised form: 20 December 2013 / Accepted: 26 December 2013 / Published: 16 January 2014
PDF Full-text Download PDF Full-Text [1514 KB, uploaded 16 January 2014 13:02 CET]
Abstract: We review light assisted collisions in a high-density far-off resonant optical trap (FORT). By tuning the parameters of the light that induces the collisions, the effects of the collisions can be controlled. Trap loss can be suppressed even at high atomic densities, allowing us to count the atoms using fluorescence detection. When only two atoms are trapped, individual loss events reveal new information about the process, and the simplicity of the system allows for a numerical simulation of the dynamics. By optimizing the experimental parameters, we implement an efficient method to prepare single atoms in the FORT. Our methods can be extended to load quantum registers for quantum information processing.
Keywords: light assisted collisions; quantum information processing; single atom; dipole trap; few-body physics; thermodynamics

Article Statistics

Load and display the download statistics.

Citations to this Article

Cite This Article

MDPI and ACS Style

Fung, Y.H.; Carpentier, A.V.; Sompet, P.; Andersen, M. Two-Atom Collisions and the Loading of Atoms in Microtraps. Entropy 2014, 16, 582-606.

AMA Style

Fung YH, Carpentier AV, Sompet P, Andersen M. Two-Atom Collisions and the Loading of Atoms in Microtraps. Entropy. 2014; 16(1):582-606.

Chicago/Turabian Style

Fung, Yin H.; Carpentier, Alicia V.; Sompet, Pimonpan; Andersen, Mikkel. 2014. "Two-Atom Collisions and the Loading of Atoms in Microtraps." Entropy 16, no. 1: 582-606.

Entropy EISSN 1099-4300 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert