Characterization and Applications of Nanomaterials in Sensors and Actuators

A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanoelectronics, Nanosensors and Devices".

Deadline for manuscript submissions: closed (20 April 2024) | Viewed by 1290

Special Issue Editor


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Guest Editor
School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore
Interests: nanotechnology; 2D materials; AI-facilitated accelerated materials

Special Issue Information

Dear Colleagues,

Sensors and actuators are extensively applied in cutting-edge devices such as flexible/wearable electronics and soft robotics for applications spanning healthcare, environmental monitoring, emergency rescue/protection, and the Internet of Things. A wide range of studies have been conducted on emerging nanomaterials in different forms, which have been applied to different material systems to facilitate the desirable properties of sensing and actuation.

However, it is still challenging to maximize the performance of nanomaterials or combine distinctive nanomaterials (0-dimensional, 1-dimensional, 2-dimensional) with bulk materials while retaining their intrinsic characteristics and achieving the expected synergistic effect.

Therefore, it is still necessary to explore novel nanomaterials exhibiting intriguing physical, chemical, and electrical characteristics. Meanwhile, further research is needed regarding the advanced characterization and testing of novel nanomaterials with enhanced actuating and sensing properties. Furthermore, further attention should be paid to the smart design, fabrication, and testing of integrated material systems with improved sensor and actuator performance.

This Special Issue welcomes contributions from researchers worldwide on topics including but not limited to

  • The synthesis of novel nanomaterials with special characteristics;
  • The advanced characterization and testing of nanomaterials and nanodevices;
  • The design and fabrication of nanomaterial-integrated material systems for sensor and actuator applications;
  • Novel applications of nanomaterials in niche fields such as harsh environment assessment, in-body health monitoring, and wearable healthcare devices;
  • The application of machine learning in the design and application of nanomaterial-based systems.

Dr. Lin Jing
Guest Editor

Manuscript Submission Information

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Keywords

  • sensors
  • actuators
  • nanoscale devices
  • material analysis
  • sensing technology
  • actuation mechanisms
  • surface functionalization
  • piezoelectric materials
  • MEMS/NEMS
  • smart materials

Published Papers (1 paper)

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Research

10 pages, 5504 KiB  
Article
Magnetic-Dielectric Cantilevers for Atomic Force Microscopy
by Gala Sanchez-Seguame, Hugo Avalos-Sanchez, Jesus Eduardo Lugo, Eduardo Antonio Murillo-Bracamontes, Martha Alicia Palomino-Ovando, Orlando Hernández-Cristobal, José Juan Gervacio-Arciniega and Miller Toledo-Solano
Nanomaterials 2024, 14(10), 874; https://doi.org/10.3390/nano14100874 - 17 May 2024
Viewed by 1079
Abstract
Atomic force microscopy (AFM) is a technique that relies on detecting forces at the nanonewton scale. It involves using a cantilever with a tiny tip at one end. This tip interacts with the short- and long-range forces of material surfaces. These cantilevers are [...] Read more.
Atomic force microscopy (AFM) is a technique that relies on detecting forces at the nanonewton scale. It involves using a cantilever with a tiny tip at one end. This tip interacts with the short- and long-range forces of material surfaces. These cantilevers are typically manufactured with Si or Si3N4 and synthesized using a lithography technique, which implies a high cost. On the other hand, through simple chemical methods, it is possible to synthesize a magneto-dielectric composite made up of artificial SiO2 opals infiltrated with superparamagnetic nanoparticles of Fe3O4. From these materials, it is possible to obtain tipless cantilevers that can be used in AFM analysis. Tipless cantilevers are an alternative tool in nanoscale exploration, offering a versatile approach to surface analysis. Unlike traditional AFM probes, tipless versions eliminate the challenges associated with tip wear, ensuring prolonged stability during measurements. This makes tipless AFM particularly valuable for imaging delicate or soft samples, as it prevents sample damage and provides precise measurements of topography and mechanical and electromechanical properties. This study presents the results of the characterization of known surfaces using magneto-dielectric cantilevers and commercial cantilevers based on Si. The characterization will be carried out through contact and non-contact topography measurements. Full article
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