Reprint
Rietveld Refinement in the Characterization of Crystalline Materials
Edited by
January 2019
88 pages
- ISBN978-3-03897-527-4 (Paperback)
- ISBN978-3-03897-528-1 (PDF)
This book is a reprint of the Special Issue Rietveld Refinement in the Characterization of Crystalline Materials that was published in
Chemistry & Materials Science
Engineering
Environmental & Earth Sciences
Summary
This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.
Format
- Paperback
License and Copyright
© 2019 by the authors; CC BY-NC-ND license
Keywords
Rietveld; quantitative analysis; corrected equation; amorphous; powder structure solution; EXPO software; Rietveld refinement; Rietveld refinement; quantitative X-ray diffraction; microalloyed steels; matrix dissolution; X70; ICP; diamond; synthesis; high pressure; high temperature; X-ray powder diffraction; Rietveld refinement; thermosalient materials; jumping crystals; scopolamine bromide; negative thermal expansion; HT-XRPD; clathrate hydrate; powder X-ray diffraction; Rietveld refinement; x-ray powder diffraction; rietveld method; quantitative XRD phase analysis; aluminum electrolyte; cryolite ratio; genetic algorithms; self-configuration