Sections & Special Issues - J. Low Power Electron. Appl.
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| Special Issue Title Special Issue Editors |
Submission Deadline | Articles |
|---|---|---|
| Resiliency, Robustness, and Reliability (R3) for VLSI Circuits and Systems Massimo Alioto, Paul Ampadu |
01 July 2013 | 0 |
| Selected Papers from FTFC 2013 Conference Amara Amara, Alex Yakovlev, Olivier Thomas, Costin Anghel |
30 September 2013 | 0 |
J. Low Power Electron. Appl.
EISSN 2079-9268
Published by MDPI AG, Basel, Switzerland
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