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Photonics 2017, 4(2), 29; doi:10.3390/photonics4020029

Polarization Characterization of Soft X-Ray Radiation at FERMI FEL-2

1
Elettra-Sincrotrone Trieste, Strada Statale 14-km 163,5 in AREA Science Park, 34149 Trieste, Italy
2
Università degli Studi di Trieste, Dipartimento di Fisica, Piazzale Europa 1, 34127 Trieste, Italy
3
IOM-CNR, Laboratorio TASC, 34149 Trieste, Italy
4
European XFEL GmbH, Holzkoppel 4, 22869 Schenefeld, Germany
5
DESY, Notkestrasse 85, 22607 Hamburg, Germany
6
ENEA, Via Enrico Fermi 45, 00044 Frascati, Italy
Current address: Particle Accelerator Physics Laboratory, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
Current address: Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland
§
Current address: Institut für Physik und CINSaT, Universität Kassel, Heinrich-Plett-Strasse 40, 34132 Kassel,Germany
*
Author to whom correspondence should be addressed.
Received: 31 January 2017 / Revised: 4 April 2017 / Accepted: 5 April 2017 / Published: 10 April 2017
(This article belongs to the Special Issue Extreme UV Lasers: Technologies and Applications)
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Abstract

The control of polarization state in soft and hard X-ray light is of crucial interest to probe structural and symmetry properties of matter. Thanks to their Apple-II type undulators, the FERMI-Free Electron Lasers are able to provide elliptical, circular or linearly polarized light within the extreme ultraviolet and soft X-ray range. In this paper, we report the characterization of the polarization state of FERMI FEL-2 down to 5 nm. The results show a high degree of polarization of the FEL pulses, typically above 95%. The campaign of measurements was performed at the Low Density Matter beamline using an electron Time-Of-Flight based polarimeter. View Full-Text
Keywords: free-electron laser; extreme ultraviolet; soft X-ray; polarization control free-electron laser; extreme ultraviolet; soft X-ray; polarization control
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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MDPI and ACS Style

Roussel, E.; Allaria, E.; Callegari, C.; Coreno, M.; Cucini, R.; Mitri, S.D.; Diviacco, B.; Ferrari, E.; Finetti, P.; Gauthier, D.; Penco, G.; Raimondi, L.; Svetina, C.; Zangrando, M.; Beckmann, A.; Glaser, L.; Hartmann, G.; Scholz, F.; Seltmann, J.; Shevchuk, I.; Viefhaus, J.; Giannessi, L. Polarization Characterization of Soft X-Ray Radiation at FERMI FEL-2. Photonics 2017, 4, 29.

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