Next Article in Journal
Fundamental Study on the Effect of Spray Parameters on Characteristics of P3HT:PCBM Active Layers Made by Spray Coating
Previous Article in Journal
Evaluation of Photocatalytic Properties of Portland Cement Blended with Titanium Oxynitride (TiO2−xNy) Nanoparticles
Article Menu
Issue 3 (September) cover image

Export Article

Open AccessArticle
Coatings 2015, 5(3), 477-487; doi:10.3390/coatings5030477

Confocal Microscopy for Process Monitoring and Wide-Area Height Determination of Vertically-Aligned Carbon Nanotube Forests

1
Fraunhofer Institute for Material and Beam Technology (IWS), Winterbergstraße 28, 01277 Dresden, Germany
2
Department of Inorganic Chemistry, Dresden University of Technology, Bergstraße 66, 01062 Dresden, Germany
*
Author to whom correspondence should be addressed.
Academic Editor: Yasutaka Ando
Received: 5 June 2015 / Accepted: 3 August 2015 / Published: 7 August 2015
View Full-Text   |   Download PDF [2567 KB, uploaded 7 August 2015]   |  

Abstract

Confocal microscopy is introduced as a new and generally applicable method for the characterization of the vertically-aligned carbon nanotubes (VACNT) forest height. With this technique process control is significantly intensified. The topography of the substrate and VACNT can be mapped with a height resolution down to 15 nm. The advantages of confocal microscopy, compared to scanning electron microscopy (SEM), are demonstrated by investigating the growth kinetics of VACNT using Al2O3 buffer layers with varying thicknesses. A process optimization using confocal microscopy for fast VACNT forest height evaluation is presented. View Full-Text
Keywords: vertically aligned carbon nanotubes; forest height characterization; confocal microscopy; optical imaging; chemical vapor deposition vertically aligned carbon nanotubes; forest height characterization; confocal microscopy; optical imaging; chemical vapor deposition
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

Supplementary material

Scifeed alert for new publications

Never miss any articles matching your research from any publisher
  • Get alerts for new papers matching your research
  • Find out the new papers from selected authors
  • Updated daily for 49'000+ journals and 6000+ publishers
  • Define your Scifeed now

SciFeed Share & Cite This Article

MDPI and ACS Style

Piwko, M.; Althues, H.; Schumm, B.; Kaskel, S. Confocal Microscopy for Process Monitoring and Wide-Area Height Determination of Vertically-Aligned Carbon Nanotube Forests. Coatings 2015, 5, 477-487.

Show more citation formats Show less citations formats

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Coatings EISSN 2079-6412 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top