Next Article in Journal
An Efficient Network Coding-Based Fault-Tolerant Mechanism in WBAN for Smart Healthcare Monitoring Systems
Previous Article in Journal
Enhancing Interpretation of Ambiguous Voice Instructions based on the Environment and the User’s Intention for Improved Human-Friendly Robot Navigation
Article Menu
Issue 8 (August) cover image

Export Article

Open AccessArticle
Appl. Sci. 2017, 7(8), 822; doi:10.3390/app7080822

Picosecond Photoacoustic Metrology of SiO2 and LiNbO3 Layer Systems Used for High Frequency Surface-Acoustic-Wave Filters

1
Department of Physics, University of Konstanz, 78464 Konstanz, Germany
2
Institute of Technical Physics, German Aerospace Center, Pfaffenwaldring 38-40, 70569 Stuttgart, Germany
*
Author to whom correspondence should be addressed.
Received: 7 July 2017 / Revised: 1 August 2017 / Accepted: 7 August 2017 / Published: 10 August 2017
(This article belongs to the Section Acoustics)
View Full-Text   |   Download PDF [756 KB, uploaded 11 August 2017]   |  

Abstract

Many applications of thin films necessitate detailed information about their thicknesses and sound velocities. Here, we study SiO2/LiNbO3 layer systems by picosecond photoacoustic metrology and measure the sound velocities of the respective layers and the film thickness of SiO2, which pose crucial information for the fabrication of surface-acoustic-wave filters for communication technology. Additionally, we utilize the birefringence and the accompanying change in the detection sensitivity of coherent acoustic phonons in the LiNbO3 layer to infer information about the LiNbO3 orientation and the layer interface. View Full-Text
Keywords: picosecond photoacoustic metrology; LiNbO3; SiO2; surface-acoustic-wave filters picosecond photoacoustic metrology; LiNbO3; SiO2; surface-acoustic-wave filters
Figures

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

Scifeed alert for new publications

Never miss any articles matching your research from any publisher
  • Get alerts for new papers matching your research
  • Find out the new papers from selected authors
  • Updated daily for 49'000+ journals and 6000+ publishers
  • Define your Scifeed now

SciFeed Share & Cite This Article

MDPI and ACS Style

Brick, D.; Emre, E.; Grossmann, M.; Dekorsy, T.; Hettich, M. Picosecond Photoacoustic Metrology of SiO2 and LiNbO3 Layer Systems Used for High Frequency Surface-Acoustic-Wave Filters. Appl. Sci. 2017, 7, 822.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Appl. Sci. EISSN 2076-3417 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top