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Crystals 2016, 6(8), 87; doi:10.3390/cryst6080087

X-ray Diffraction: A Powerful Technique for the Multiple-Length-Scale Structural Analysis of Nanomaterials

Istituto di Cristallografia, Consiglio Nazionale delle Ricerche, Via Amendola 122-O, Bari I-70126, Italy
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Academic Editor: Helmut Cölfen
Received: 22 June 2016 / Revised: 19 July 2016 / Accepted: 29 July 2016 / Published: 4 August 2016
(This article belongs to the Special Issue Colloidal Nanocrystals: Synthesis, Characterization and Application)
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Abstract

During recent decades innovative nanomaterials have been extensively studied, aiming at both investigating the structure-property relationship and discovering new properties, in order to achieve relevant improvements in current state-of-the art materials. Lately, controlled growth and/or assembly of nanostructures into hierarchical and complex architectures have played a key role in engineering novel functionalized materials. Since the structural characterization of such materials is a fundamental step, here we discuss X-ray scattering/diffraction techniques to analyze inorganic nanomaterials under different conditions: dispersed in solutions, dried in powders, embedded in matrix, and deposited onto surfaces or underneath them. View Full-Text
Keywords: X-ray diffraction; nanomaterials; microscopy X-ray diffraction; nanomaterials; microscopy
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Giannini, C.; Ladisa, M.; Altamura, D.; Siliqi, D.; Sibillano, T.; De Caro, L. X-ray Diffraction: A Powerful Technique for the Multiple-Length-Scale Structural Analysis of Nanomaterials. Crystals 2016, 6, 87.

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