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Crystals 2016, 6(11), 141; doi:10.3390/cryst6110141

Determination of the Projected Atomic Potential by Deconvolution of the Auto-Correlation Function of TEM Electron Nano-Diffraction Patterns

1
Istituto di Cristallografia, Consiglio Nazionale delle Ricerche (IC-CNR), via Amendola 122/O, 70126 Bari, Italy
2
Istituto Officina dei Materiali, Laboratorio Tecnologie Avanzate, Superfici e Catalisi, Consiglio Nazionale delle Ricerche (IOM-TASC-CNR), Area Science Park-Basovizza, Bld MM S.S. 14, 34149 Trieste, Italy
*
Author to whom correspondence should be addressed.
Academic Editor: Haidong Zhou
Received: 16 September 2016 / Revised: 27 October 2016 / Accepted: 31 October 2016 / Published: 3 November 2016
(This article belongs to the Special Issue Correlated Electron Crystals)
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Abstract

We present a novel method to determine the projected atomic potential of a specimen directly from transmission electron microscopy coherent electron nano-diffraction patterns, overcoming common limitations encountered so far due to the dynamical nature of electron-matter interaction. The projected potential is obtained by deconvolution of the inverse Fourier transform of experimental diffraction patterns rescaled in intensity by using theoretical values of the kinematical atomic scattering factors. This novelty enables the compensation of dynamical effects typical of transmission electron microscopy (TEM) experiments on standard specimens with thicknesses up to a few tens of nm. The projected atomic potentials so obtained are averaged on sample regions illuminated by nano-sized electron probes and are in good quantitative agreement with theoretical expectations. Contrary to lens-based microscopy, here the spatial resolution in the retrieved projected atomic potential profiles is related to the finer lattice spacing measured in the electron diffraction pattern. The method has been successfully applied to experimental nano-diffraction data of crystalline centrosymmetric and non-centrosymmetric specimens achieving a resolution of 65 pm. View Full-Text
Keywords: transmission electron microscopy; coherent diffraction imaging; electron crystallography; atomic potential transmission electron microscopy; coherent diffraction imaging; electron crystallography; atomic potential
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De Caro, L.; Scattarella, F.; Carlino, E. Determination of the Projected Atomic Potential by Deconvolution of the Auto-Correlation Function of TEM Electron Nano-Diffraction Patterns. Crystals 2016, 6, 141.

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