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Journal: Materials, 2012
Volume: 5
Page(s): 2498-2520
2498-2520
Article: Degradation Mechanisms for GaN and GaAs High Speed Transistors
Cheney, D.J.; Douglas, E.A.; Liu, L.; Lo, C.-F.; Gila, B.P.; Ren, F.; Pearton, S.J.

http://www.mdpi.com/1996-1944/5/12/2498

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