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Materials 2010, 3(6), 3565-3613; doi:10.3390/ma3063565
Review
Element Specific Versus Integral Structural and Magnetic Properties of Co:ZnO and Gd:GaN Probed with Hard X-ray Absorption Spectroscopy
Fakultät für Physik, Universität Duisburg-Essen, Lotharstr. 1, D-47057 Duisburg, Germany
Received: 1 April 2010; in revised form: 20 April 2010 / Accepted: 31 May 2010 / Published: 7 June 2010
(This article belongs to the Special Issue Ferromagnetic Semiconductors)
Abstract: Dilute magnetic semiconductors (DMS) are envisioned as sources of spin-polarized carriers for future semiconductor devices which simultaneously utilize spin and charge of the carriers. The hope of discovering a DMS with ferromagnetic order up to room temperature still motivates research on suitable DMS materials. Two candidate wide-band gap DMS are Gd:GaN and Co:ZnO. We have used hard X-ray absorption spectroscopy (XAS) and in particular X-ray linear dichroism (XLD) and X-ray magnetic circular dichroism (XMCD) to study both DMS materials with element specificity and compare these findings with results from integral SQUID magnetometry as well as electron paramagnetic resonance (EPR).
Keywords: dilute magnetic semiconductors; magnetic properties; X-ray absorption spectroscopy
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MDPI and ACS Style
Ney, A. Element Specific Versus Integral Structural and Magnetic Properties of Co:ZnO and Gd:GaN Probed with Hard X-ray Absorption Spectroscopy. Materials 2010, 3, 3565-3613.
AMA StyleNey A. Element Specific Versus Integral Structural and Magnetic Properties of Co:ZnO and Gd:GaN Probed with Hard X-ray Absorption Spectroscopy. Materials. 2010; 3(6):3565-3613.
Chicago/Turabian StyleNey, Andreas. 2010. "Element Specific Versus Integral Structural and Magnetic Properties of Co:ZnO and Gd:GaN Probed with Hard X-ray Absorption Spectroscopy." Materials 3, no. 6: 3565-3613.
Materials
EISSN 1996-1944
Published by MDPI AG, Basel, Switzerland
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