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Materials 2009, 2(3), 1402-1416; doi:10.3390/ma2031402

A Novel Approach for Automated Analysis of Cell Attachment and Spreading Based on Backscattered Electron Imaging by Scanning Electron Microscopy

1
Fraunhofer IBMT, Ensheimer Str.48, 66386 St.Ingbert, Germany
2
Perkin Elmer Cellular Technologies GmbH, Schnackenburgallee 114, 22525 Hamburg, Germany
*
Author to whom correspondence should be addressed.
Received: 17 August 2009 / Revised: 21 September 2009 / Accepted: 23 September 2009 / Published: 24 September 2009
(This article belongs to the Special Issue Advances in Biomaterials)
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Abstract

The development of new materials for biological application requires in vitro testing of cell/surface interactions. Cell adhesion and spreading are difficult to quantify as most materials are non-transparent and transmission microscopy cannot be used. Contrast in reflection microscopy is rather poor. We propose an alternative method for the automated screening of cell attachment and spreading using backscattered electron imaging of scanning electron microscopy. The enhanced cell contrast permits study of cell/material interactions by little differences between cells and material. View Full-Text
Keywords: cell adhesion; cell spreading; cytocompatibility of materials; cell/material interactions; scanning electron microscopy; backscattered electron imaging; image analysis cell adhesion; cell spreading; cytocompatibility of materials; cell/material interactions; scanning electron microscopy; backscattered electron imaging; image analysis
This is an open access article distributed under the Creative Commons Attribution License (CC BY 3.0).

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MDPI and ACS Style

Katsen-Globa, A.; Peter, L.; Zöllner, S.; Dörge, T.; Daffertshofer, M.; Preckel, H.; Schmitt, D.; Zimmermann, H. A Novel Approach for Automated Analysis of Cell Attachment and Spreading Based on Backscattered Electron Imaging by Scanning Electron Microscopy. Materials 2009, 2, 1402-1416.

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