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Sensors 2008, 8(3), 1915-1926; doi:10.3390/s8031915
Article
A Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Sampling
1
Graduate School of Electronic Science and Technology, Shizuoka University, 3-5-1 Johoku, Nakaku, Hamamatsu 432-8011, Japan
2
Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Nakaku, Hamamatsu 432-8011, Japan
* Author to whom correspondence should be addressed.
Received: 25 December 2007 / Accepted: 12 March 2008 / Published: 18 March 2008
(This article belongs to the Special Issue Integrated High-performance Imagers)
Download PDF Full-Text [346 KB, uploaded 16 September 2008 11:01 CEST]
Abstract: A dynamic range expansion technique for CMOS image sensors with dual charge storage in a pixel and multiple sampling technique is presented. Each pixel contains a photodiode and a storage diode which is connected to the photodiode via a separation gate. The sensitivity of the signal charge in the storage diode can be controlled either by a separation gate which limits the charge to flow into the storage diode or by controlling the accumulation time in the storage diode. The operation of the sensitivity control with separation gate techniques is simulated and it is found that a blocking layer to the storage diode plays an important role for high controllability of sensitivity of the storage diode. A prototype chip for testing multiple short time accumulations is fabricated and measured.
Keywords: Image sensor; wide dynamic range; multiple sampling; motion blur.
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MDPI and ACS Style
Shafie, S.; Kawahito, S.; Itoh, S. A Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Sampling. Sensors 2008, 8, 1915-1926.
AMA StyleShafie S, Kawahito S, Itoh S. A Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Sampling. Sensors. 2008; 8(3):1915-1926.
Chicago/Turabian StyleShafie, Suhaidi; Kawahito, Shoji; Itoh, Shinya. 2008. "A Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Sampling." Sensors 8, no. 3: 1915-1926.