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Sensors 2017, 17(4), 938; doi:10.3390/s17040938

Progress in the Correlative Atomic Force Microscopy and Optical Microscopy

State Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, China
University of Chinese Academy of Sciences, Beijing 100049, China
The Second Hospital of Jilin University, Changchun 130041, China
Authors to whom correspondence should be addressed.
Academic Editor: Masateru Taniguchi
Received: 27 February 2017 / Revised: 12 April 2017 / Accepted: 20 April 2017 / Published: 24 April 2017
(This article belongs to the Special Issue Single-Molecule Sensing)
View Full-Text   |   Download PDF [5466 KB, uploaded 24 April 2017]   |  


Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized molecular groups and has many shortcomings in the aspects of determining the mechanism of the interactions and the elaborate structure due to the limitations of the technology, itself, such as non-specificity and low imaging speed. To overcome the technical limitations, it is necessary to combine AFM with other complementary techniques, such as fluorescence microscopy. The combination of several complementary techniques in one instrument has increasingly become a vital approach to investigate the details of the interactions among molecules and molecular dynamics. In this review, we reported the principles of AFM and optical microscopy, such as confocal microscopy and single-molecule localization microscopy, and focused on the development and use of correlative AFM and optical microscopy. View Full-Text
Keywords: atomic force microscopy; conventional florescence microscopy; super-resolution fluorescence microscopy; correlation atomic force microscopy; conventional florescence microscopy; super-resolution fluorescence microscopy; correlation

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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Zhou, L.; Cai, M.; Tong, T.; Wang, H. Progress in the Correlative Atomic Force Microscopy and Optical Microscopy. Sensors 2017, 17, 938.

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