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Sensors 2013, 13(9), 12295-12328; doi:10.3390/s130912295

Currents Induced by Injected Charge in Junction Detectors

* ,
Institute of Applied Research, Vilnius University, Sauletekio av. 9-III, LT-10223, Vilnius, Lithuania
* Author to whom correspondence should be addressed.
Received: 25 July 2013 / Revised: 21 August 2013 / Accepted: 4 September 2013 / Published: 12 September 2013
(This article belongs to the Special Issue Photodetectors)
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The problem of drifting charge-induced currents is considered in order to predict the pulsed operational characteristics in photo-and particle-detectors with a junction controlled active area. The direct analysis of the field changes induced by drifting charge in the abrupt junction devices with a plane-parallel geometry of finite area electrodes is presented. The problem is solved using the one-dimensional approach. The models of the formation of the induced pulsed currents have been analyzed for the regimes of partial and full depletion. The obtained solutions for the current density contain expressions of a velocity field dependence on the applied voltage, location of the injected surface charge domain and carrier capture parameters. The drift component of this current coincides with Ramo’s expression. It has been illustrated, that the synchronous action of carrier drift, trapping, generation and diffusion can lead to a vast variety of possible current pulse waveforms. Experimental illustrations of the current pulse variations determined by either the rather small or large carrier density within the photo-injected charge domain are presented, based on a study of Si detectors.
Keywords: photo-detectors; particle-detectors; Ramo’s current; injected charge drift current photo-detectors; particle-detectors; Ramo’s current; injected charge drift current
This is an open access article distributed under the Creative Commons Attribution License (CC BY) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Gaubas, E.; Ceponis, T.; Kalesinskas, V. Currents Induced by Injected Charge in Junction Detectors. Sensors 2013, 13, 12295-12328.

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