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Next Generation AT-Cut Quartz Crystal Sensing Devices
AbstractGenerally, AT-cut quartz crystals have a limited scope of use when it comes to high-precision measurement of very small impedance changes due to their nonlinear frequency-temperature characteristics in the range between 0 °C and 50 °C. The new method improving quartz oscillator frequency-temperature characteristic compensation is switching between two impedance loads. By modifying the oscillator circuit with two logic switches and two impedance loads, the oscillator can switch oscillation between two resonance frequencies. The difference in resonance frequencies compensates the frequency-temperature characteristics influence as well as the influence of offset and quartz crystal ageing. The experimental results show that the new approach using the switching method highly improves second-to-second frequency stability from ±0.125 Hz to ±0.00001 Hz and minute-to-minute frequency stability from 0.1 Hz to 0.0001 Hz, which makes the high-precision measurement of aF and fH changes possible.
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Matko, V. Next Generation AT-Cut Quartz Crystal Sensing Devices. Sensors 2011, 11, 4474-4482.View more citation formats
Matko V. Next Generation AT-Cut Quartz Crystal Sensing Devices. Sensors. 2011; 11(5):4474-4482.Chicago/Turabian Style
Matko, Vojko. 2011. "Next Generation AT-Cut Quartz Crystal Sensing Devices." Sensors 11, no. 5: 4474-4482.
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