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Next Generation AT-Cut Quartz Crystal Sensing Devices
Faculty of Electrical Engineering and Computer Science, University of Maribor, Smetanova 17, 2000 Maribor, Slovenia
Received: 17 January 2011; in revised form: 1 April 2011 / Accepted: 6 April 2011 / Published: 27 April 2011
Abstract: Generally, AT-cut quartz crystals have a limited scope of use when it comes to high-precision measurement of very small impedance changes due to their nonlinear frequency-temperature characteristics in the range between 0 °C and 50 °C. The new method improving quartz oscillator frequency-temperature characteristic compensation is switching between two impedance loads. By modifying the oscillator circuit with two logic switches and two impedance loads, the oscillator can switch oscillation between two resonance frequencies. The difference in resonance frequencies compensates the frequency-temperature characteristics influence as well as the influence of offset and quartz crystal ageing. The experimental results show that the new approach using the switching method highly improves second-to-second frequency stability from ±0.125 Hz to ±0.00001 Hz and minute-to-minute frequency stability from 0.1 Hz to 0.0001 Hz, which makes the high-precision measurement of aF and fH changes possible.
Keywords: quartz crystal; switching oscillating method; temperature characteristic compensation
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Cite This Article
MDPI and ACS Style
Matko, V. Next Generation AT-Cut Quartz Crystal Sensing Devices. Sensors 2011, 11, 4474-4482.
Matko V. Next Generation AT-Cut Quartz Crystal Sensing Devices. Sensors. 2011; 11(5):4474-4482.
Matko, Vojko. 2011. "Next Generation AT-Cut Quartz Crystal Sensing Devices." Sensors 11, no. 5: 4474-4482.