Sensors 2011, 11(3), 2525-2565; doi:10.3390/s110302525

Non-Destructive Techniques Based on Eddy Current Testing

1 Department of Signal Theory, Communications and Telematic Engineering, University of Valladolid (UVA), 47011 Valladolid, Spain 2 Ingeniería y Sistemas de Ensayos no Destructivos (ISEND), Ed. Galileo Azul, 103, 47151 P. T. Boecillo Valladolid, Spain
* Author to whom correspondence should be addressed.
Received: 5 January 2011; in revised form: 19 January 2011 / Accepted: 9 February 2011 / Published: 28 February 2011
(This article belongs to the Special Issue Advanced Sensing Technology for Nondestructive Evaluation)
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Abstract: Non-destructive techniques are used widely in the metal industry in order to control the quality of materials. Eddy current testing is one of the most extensively used non-destructive techniques for inspecting electrically conductive materials at very high speeds that does not require any contact between the test piece and the sensor. This paper includes an overview of the fundamentals and main variables of eddy current testing. It also describes the state-of-the-art sensors and modern techniques such as multi-frequency and pulsed systems. Recent advances in complex models towards solving crack-sensor interaction, developments in instrumentation due to advances in electronic devices, and the evolution of data processing suggest that eddy current testing systems will be increasingly used in the future.
Keywords: non-destructive testing; eddy current; magnetic field; sensor; coil probe; impedance; crack; impedance plane; conductivity

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MDPI and ACS Style

García-Martín, J.; Gómez-Gil, J.; Vázquez-Sánchez, E. Non-Destructive Techniques Based on Eddy Current Testing. Sensors 2011, 11, 2525-2565.

AMA Style

García-Martín J, Gómez-Gil J, Vázquez-Sánchez E. Non-Destructive Techniques Based on Eddy Current Testing. Sensors. 2011; 11(3):2525-2565.

Chicago/Turabian Style

García-Martín, Javier; Gómez-Gil, Jaime; Vázquez-Sánchez, Ernesto. 2011. "Non-Destructive Techniques Based on Eddy Current Testing." Sensors 11, no. 3: 2525-2565.

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