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Simplified Interval Observer Scheme: A New Approach for Fault Diagnosis in Instruments
AbstractThere are different schemes based on observers to detect and isolate faults in dynamic processes. In the case of fault diagnosis in instruments (FDI) there are different diagnosis schemes based on the number of observers: the Simplified Observer Scheme (SOS) only requires one observer, uses all the inputs and only one output, detecting faults in one detector; the Dedicated Observer Scheme (DOS), which again uses all the inputs and just one output, but this time there is a bank of observers capable of locating multiple faults in sensors, and the Generalized Observer Scheme (GOS) which involves a reduced bank of observers, where each observer uses all the inputs and m-1 outputs, and allows the localization of unique faults. This work proposes a new scheme named Simplified Interval Observer SIOS-FDI, which does not requires the measurement of any input and just with just one output allows the detection of unique faults in sensors and because it does not require any input, it simplifies in an important way the diagnosis of faults in processes in which it is difficult to measure all the inputs, as in the case of biologic reactors.
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Martínez-Sibaja, A.; Astorga-Zaragoza, C.M.; Alvarado-Lassman, A.; Posada-Gómez, R.; Aguila-Rodríguez, G.; Rodríguez-Jarquin, J.P.; Adam-Medina, M. Simplified Interval Observer Scheme: A New Approach for Fault Diagnosis in Instruments. Sensors 2011, 11, 612-622.View more citation formats
Martínez-Sibaja A, Astorga-Zaragoza CM, Alvarado-Lassman A, Posada-Gómez R, Aguila-Rodríguez G, Rodríguez-Jarquin JP, Adam-Medina M. Simplified Interval Observer Scheme: A New Approach for Fault Diagnosis in Instruments. Sensors. 2011; 11(1):612-622.Chicago/Turabian Style
Martínez-Sibaja, Albino; Astorga-Zaragoza, Carlos M.; Alvarado-Lassman, Alejandro; Posada-Gómez, Rubén; Aguila-Rodríguez, Gerardo; Rodríguez-Jarquin, José P.; Adam-Medina, Manuel. 2011. "Simplified Interval Observer Scheme: A New Approach for Fault Diagnosis in Instruments." Sensors 11, no. 1: 612-622.
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