Next Article in Journal
Source Localization by Entropic Inference and Backward Renormalization Group Priors
Next Article in Special Issue
Conceptual Inadequacy of the Shore and Johnson Axioms for Wide Classes of Complex Systems
Previous Article in Journal
Thermodynamic Analysis of Double-Stage Compression Transcritical CO2 Refrigeration Cycles with an Expander
Previous Article in Special Issue
Extreme Value Laws for Superstatistics
Article Menu

Export Article

Open AccessArticle
Entropy 2015, 17(5), 2556-2572; doi:10.3390/e17052556

Optimum Accelerated Degradation Tests for the Gamma Degradation Process Case under the Constraint of Total Cost

Memory Division, Samsung Electronics Co., Ltd., Gyeonggi, 445-701, Korea
Academic Editor: Antonio Scarfone
Received: 25 February 2015 / Revised: 14 April 2015 / Accepted: 20 April 2015 / Published: 23 April 2015
(This article belongs to the Collection Advances in Applied Statistical Mechanics)
View Full-Text   |   Download PDF [762 KB, uploaded 23 April 2015]   |  

Abstract

An accelerated degradation test (ADT) is regarded as an effective alternative to an accelerated life test in the sense that an ADT can provide more accurate information on product reliability, even when few or no failures may be expected before the end of a practical test period. In this paper, statistical methods for optimal designing ADT plans are developed assuming that the degradation characteristic follows a gamma process (GP). The GP-based approach has an advantage that it can deal with more frequently encountered situations in which the degradation should always be nonnegative and strictly increasing over time. The optimal ADT plan is developed under the total experimental cost constraint by determining the optimal settings of variables such as the number of measurements, the measurement times, the test stress levels and the number of units allocated to each stress level such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized. In addition, compromise plans are developed to provide means to check the adequacy of the assumed acceleration model. Finally, sensitivity analysis procedures for assessing the effects of the uncertainties in the pre-estimates of unknown parameters are illustrated with an example. View Full-Text
Keywords: accelerated degradation test; gamma process; optimal plan; compromise plan; maximum likelihood estimation accelerated degradation test; gamma process; optimal plan; compromise plan; maximum likelihood estimation
Figures

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

Scifeed alert for new publications

Never miss any articles matching your research from any publisher
  • Get alerts for new papers matching your research
  • Find out the new papers from selected authors
  • Updated daily for 49'000+ journals and 6000+ publishers
  • Define your Scifeed now

SciFeed Share & Cite This Article

MDPI and ACS Style

Lim, H. Optimum Accelerated Degradation Tests for the Gamma Degradation Process Case under the Constraint of Total Cost. Entropy 2015, 17, 2556-2572.

Show more citation formats Show less citations formats

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Entropy EISSN 1099-4300 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top