Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials
Abstract
:1. Introduction
2. Materials and Methods
2.1. Evaluation of the Organic Film Dielectric Tensor in Correspndence of Absorption Resonances
2.2. Calculation of Light Propagation in the Layered Medium
2.3. Experimental Methods
3. Results and Discussion
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Pasquali, L.; Mahne, N.; Giglia, A.; Verna, A.; Sponza, L.; Capelli, R.; Bonfatti, M.; Mezzadri, F.; Galligani, E.; Nannarone, S. Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials. Surfaces 2021, 4, 18-30. https://doi.org/10.3390/surfaces4010004
Pasquali L, Mahne N, Giglia A, Verna A, Sponza L, Capelli R, Bonfatti M, Mezzadri F, Galligani E, Nannarone S. Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials. Surfaces. 2021; 4(1):18-30. https://doi.org/10.3390/surfaces4010004
Chicago/Turabian StylePasquali, Luca, Nicola Mahne, Angelo Giglia, Adriano Verna, Lorenzo Sponza, Raffaella Capelli, Matteo Bonfatti, Francesco Mezzadri, Emanuele Galligani, and Stefano Nannarone. 2021. "Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials" Surfaces 4, no. 1: 18-30. https://doi.org/10.3390/surfaces4010004