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J. Imaging 2017, 3(2), 22; doi:10.3390/jimaging3020022

Measuring Leaf Thickness with 3D Close-Up Laser Scanners: Possible or Not?

Institue of Geodesy and Geoinformation, University of Bonn, Nussallee 17, 53115 Bonn, Germany
Author to whom correspondence should be addressed.
Academic Editors: Gui N. DeSouza and Christopher Topp
Received: 30 March 2017 / Revised: 29 May 2017 / Accepted: 10 June 2017 / Published: 15 June 2017
(This article belongs to the Special Issue 2D, 3D and 4D Imaging for Plant Phenotyping)
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Measuring the 3D shape of plants for phenotyping purposes using active 3D laser scanning devices has become an important field of research. While the acquisition of stem and root structure is mostly straightforward, extensive and non-invasive measuring of the volumetric shape of leaves, i.e., the leaf thickness, is more challenging. Therefore, the purpose of this paper is to examine whether the leaf thickness is measurable using a high precision industrial laser scanning system. The study comprises a metrological investigation of the accuracy of the laser scanning system with regards to thickness measurements as well as experiments for leaf thickness measurements using several leaves of three different types of crop. The results indicate that although the measuring system is principally able to measure thicknesses of about 74 μ m with statistical certainty, the leaf thickness is not measurable accurately. The reason for this can be attributed to the measurable penetration depth of the laser scanner combined with the variation of the angle of incidence. These effects cause systematic uncertainties and significant variations of the derived leaf thickness. View Full-Text
Keywords: plant phenotyping, leaf thickness; close-up laser scanning; coordinate measuring arm plant phenotyping, leaf thickness; close-up laser scanning; coordinate measuring arm

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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Dupuis, J.; Holst, C.; Kuhlmann, H. Measuring Leaf Thickness with 3D Close-Up Laser Scanners: Possible or Not? J. Imaging 2017, 3, 22.

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