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Crystals 2016, 6(7), 71; doi:10.3390/cryst6070071

Optical and X-Ray Topographic Studies of Dislocations, Growth-Sector Boundaries, and Stacking Faults in Synthetic Diamonds

1
Department of Physics, Royal Holloway University of London, Surrey, TW20 0EX Egham, UK
2
Hilti Corporation, Feldkircherstrasse 100, 9494 Schaan, Liechtenstein
3
The Institute of Electronic Materials Technology, 133, 01-919Warsaw Wólczyńska, Poland
*
Author to whom correspondence should be addressed.
Academic Editor: Ronald Armstrong
Received: 2 May 2016 / Revised: 13 June 2016 / Accepted: 17 June 2016 / Published: 24 June 2016
(This article belongs to the Special Issue Crystal Dislocations)
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Abstract

The characterization of growth features and defects in various high-pressure high-temperature (HPHT) synthetic diamonds has been achieved with optical and X-ray topographic techniques. For the X-ray studies, both characteristic and synchrotron radiation were used. The defects include dislocations, stacking faults, growth banding, growth sector boundaries, and metal inclusions. The directions of the Burgers vectors of many dislocations (edge, screw, and mixed 30°, 60°, and 73.2°), and the fault vectors of stacking faults, were determined as <110> and 1/3 <111> respectively. Some dislocations were generated at metallic inclusions; and some dislocations split with the formation of stacking faults. View Full-Text
Keywords: birefringence measurements; Burgers vectors; diamond; dislocations; fault vectors; growth-sector boundaries; Metripol system; optical microscopy; stacking faults; synthetic diamond; X-ray topography birefringence measurements; Burgers vectors; diamond; dislocations; fault vectors; growth-sector boundaries; Metripol system; optical microscopy; stacking faults; synthetic diamond; X-ray topography
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Moore, M.; Nailer, S.G.; Wierzchowski, W.K. Optical and X-Ray Topographic Studies of Dislocations, Growth-Sector Boundaries, and Stacking Faults in Synthetic Diamonds. Crystals 2016, 6, 71.

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