Remote Sens. 2009, 1(2), 92-106; doi:10.3390/rs1020092
Article

RPV Model Parameters Based on Hyperspectral Bidirectional Reflectance Measurementsof Fagus sylvatica L. Leaves

1 Department of Biosystems, Katholieke Universiteit Leuven, M3-BIORES, Willem de Croylaan 34, BE-3001 Leuven, Belgium 2 Department of Earth and Environmental Sciences, Katholieke Universiteit Leuven, Celestijnenlaan 200 E, BE-3001 Leuven, Belgium 3 Department of Computer Sciences, Katholieke Universiteit Leuven, Celestijnenlaan 200A, BE-3001 Leuven, Belgium
* Author to whom correspondence should be addressed.
Received: 6 April 2009; in revised form: 31 May 2009 / Accepted: 10 June 2009 / Published: 11 June 2009
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Abstract: The bidirectional reflectance parametric and semi-empirical Rahman-Pinty-Verstraete (RPV) model was inverted based on Bidirectional Reflectance Factor (BRF) measurements of 60 Fagus sylvatica L. leaves in the optical domain between 400 nm and 2,500 nm. This was accomplished using data retrieved from the Compact Laboratory Spectro-Goniometer (CLabSpeG) with an azimuth and zenith angular step of 30 and 15 degrees, respectively. Wavelength depended RPV parameters describing the leaf reflectance shape (rho0), the curve convexity (k) and the dominant forward scattering (Θ) were derived using the RPVinversion-2 software (Joint Research Centre) package with Correlation Coefficient values between modelled and measured data varying between 0.71 and 0.99 for all wavelengths, azimuth and zenith positions. The RPV model parameters were compared with a set of leaves not participating in the inversion procedure and presented Correlation Coefficient values ranging between 0.64 and 0.94 suggesting that RPV could be also used for simulating single canopy elements such as leaves.
Keywords: BRF-measurement; goniometer; spectroradiometer; Fagus sylvatica L.; leaves; Rahman-Pinty-Verstraete reflectance model

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MDPI and ACS Style

Biliouris, D.; Van der Zande, D.; Verstraeten, W.W.; Stuckens, J.; Muys, B.; Dutré, P.; Coppin, P. RPV Model Parameters Based on Hyperspectral Bidirectional Reflectance Measurementsof Fagus sylvatica L. Leaves. Remote Sens. 2009, 1, 92-106.

AMA Style

Biliouris D, Van der Zande D, Verstraeten WW, Stuckens J, Muys B, Dutré P, Coppin P. RPV Model Parameters Based on Hyperspectral Bidirectional Reflectance Measurementsof Fagus sylvatica L. Leaves. Remote Sensing. 2009; 1(2):92-106.

Chicago/Turabian Style

Biliouris, Dimitrios; Van der Zande, Dimitry; Verstraeten, Willem W.; Stuckens, Jan; Muys, Bart; Dutré, Philip; Coppin, Pol. 2009. "RPV Model Parameters Based on Hyperspectral Bidirectional Reflectance Measurementsof Fagus sylvatica L. Leaves." Remote Sens. 1, no. 2: 92-106.

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