Order Reprints
Journal: Int. J. Mol. Sci., 2011
Volume: 12
Page(s): 2200-2215
Article:
Characterization of Doped Amorphous Silicon Thin Films through the Investigation of Dopant Elements by Glow Discharge Spectrometry: A Correlation of Conductivity and Bandgap Energy Measurements
Sánchez, P.; Lorenzo, O.; Menéndez, A.; Menéndez, J.L.; Gomez, D.; Pereiro, R.; Fernández, B.
http://www.mdpi.com/1422-0067/12/4/2200
