Journal: Int. J. Mol. Sci., 2011
Article: Characterization of Doped Amorphous Silicon Thin Films through the Investigation of Dopant Elements by Glow Discharge Spectrometry: A Correlation of Conductivity and Bandgap Energy Measurements
Authors: Pascal Sánchez, Olaya Lorenzo, Armando Menéndez, Jose Luis Menéndez, David Gomez, Rosario Pereiro and Beatriz Fernández
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