Recent Advances in X-ray Sensing and Imaging
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Sensing and Imaging".
Deadline for manuscript submissions: 30 July 2024 | Viewed by 885
Special Issue Editor
Interests: diagnostic imaging; X-ray spectral imaging; quantitative imaging; statistical assessment; machine learning; clinical study design
Special Issue Information
Dear Colleagues,
The realm of X-ray imaging and sensing is currently undergoing a transformative era marked by remarkable advancements in detector technologies. Photon-counting X-ray detectors (PCDs) and high-spatial-resolution detectors, particularly those utilizing direct conversion methods, are leading this revolution. These technological leaps have significantly enhanced spectral imaging applications, heralding a new era of ultra-high-resolution computed tomography (CT) and pioneering applications in fields like X-ray phase-contrast imaging and X-ray coherent scatter imaging.
The impacts of these advancements are profound. PCDs, for instance, allow for the simultaneous capturing and discernment of spectral information, a feat previously unattainable with traditional detectors. This capability is pivotal in differentiating between materials and tissues based on their energy-dependent attenuation characteristics, opening new avenues in diagnostic imaging and material sciences.
Furthermore, the development of high-spatial-resolution detectors has enabled unprecedented detail in imaging, pushing the boundaries of what can be visualized and diagnosed. Enhanced resolution is particularly beneficial in fields requiring meticulous detail, such as neurology, orthopedics, and oncology.
Major CT manufacturers are actively developing PCD prototypes, demonstrating the significant industry investment and recognition of the potential for these innovative detectors to transform medical diagnostics and industrial applications. This is further evidenced by the early adoption of these detectors in clinical practice.
The purpose of this Special Issue is to showcase the latest developments of X-ray sensing and imaging technologies and explore their future trajectories. We aim to bring together a diverse range of research, covering (but not limited to) the following topics:
- Innovations in photon-counting X-ray detectors and their applications.
- Advances in high-spatial-resolution detectors using direct conversion methods.
- The role of these technologies in enhancing spectral imaging applications.
- The integration and impact of these detectors in ultra-high-resolution CT.
- Emerging applications in X-ray phase-contrast imaging and X-ray coherent scatter imaging.
- Clinical and industrial case studies demonstrating the practical applications of these advanced detectors.
- Quantitative data (e.g., improved resolution, reduced radiation dose) illustrating the impact of these advancements.
We invite researchers and practitioners from academia and industry to contribute their latest findings, reviews, and perspectives on these exciting developments.
Dr. Bahaa Ghammraoui
Guest Editor
Manuscript Submission Information
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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- X-ray imaging
- photon-counting detectors
- spectral imaging
- high-spatial-resolution detectors
- direct conversion detectors
- X-ray phase-contrast imaging
- X-ray coherent scatter imaging
- material characterization
- machine learning in imaging
- industrial X-ray applications
