UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors †
Abstract
1. Introduction
2. Materials and Methods
3. Results and Discussion
3.1. Influence of the UV Light
3.2. Influence of the Gate Bias
4. Conclusions
Author Contributions
Acknowledgments
Conflicts of Interest
References
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Bastuck, M.; Puglisi, D.; Spetz, A.L.; Schütze, A.; Sauerwald, T.; Andersson, M. UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors. Proceedings 2018, 2, 999. https://doi.org/10.3390/proceedings2130999
Bastuck M, Puglisi D, Spetz AL, Schütze A, Sauerwald T, Andersson M. UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors. Proceedings. 2018; 2(13):999. https://doi.org/10.3390/proceedings2130999
Chicago/Turabian StyleBastuck, Manuel, Donatella Puglisi, Anita Lloyd Spetz, Andreas Schütze, Tilman Sauerwald, and Mike Andersson. 2018. "UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors" Proceedings 2, no. 13: 999. https://doi.org/10.3390/proceedings2130999
APA StyleBastuck, M., Puglisi, D., Spetz, A. L., Schütze, A., Sauerwald, T., & Andersson, M. (2018). UV-Assisted Gate Bias Cycling in Gas-Sensitive Field-Effect Transistors. Proceedings, 2(13), 999. https://doi.org/10.3390/proceedings2130999
