*3.2. Electron Microscopy*

The resulting samples were examined by transmission electron microscopy (TEM) (Philips CM120 operating at 120 kV, equipped with an energy dispersive X-ray spectroscopy (EDS) detector (EDAX Phoenix Microanalyzer) for chemical analysis). High-resolution TEM (HRTEM) (FEI Technai F30-UT, with a field-emission gun operating at 300 kV) and scanning transmission electron microscopy (STEM) (FEI Technai F20 operating at 200 kV equipped with a high-angle annular dark field (HAADF) detector and EDS detector (EDAX-Phoenix Microanalyzer)) were also used. Complementary information was obtained by high-resolution scanning electron microscopy (HRSEM) (Zeiss Ultra model V55 and LEO model Supra 55VP equipped with an EDS detector (Oxford model INCA) and backscattering electron (BSE) detector).
