*2.4. Coating Characterization*

Free coatings were peeled from aluminum backing and weighed prior to analysis on a TA Instruments (New Castle, DE, USA) DSC Q20 differential scanning calorimeter. Under a nitrogen flow of 50 mL/min, the DSC was first equilibrated to í70 °C. The temperature was then ramped from í70 °C to 170 °C at a rate of 20 °C/min. The procedure was repeated for a second scan with a ramp rate of 10 °C/min. Glass transition temperature (*T*g) measurements were calculated based on the second scan using Universal Analysis 2000 software. The second scan was used for this value to eliminate any contamination of entrapped volatile and low molecular weight byproducts, as well as demonstrate hysteresis. Thermogravimetric analysis (TGA) was performed on a TA Instruments Q50 TGA employing heating rates of 10 °C/min under a N2 atmosphere. A Thermo Scientific Nicolet 6700 FTIR (Thermo Scientific, Waltham, MA, USA) equipped with a diamond crystal ATR attachment was utilized for film analysis. Diffuse reflectance was utilized in the characterization of neat C60 and EO3–C60. X-ray diffraction measurements were performed using a Rigaku SmartLab X-ray Diffractometer (XRD, Rigaku, Tokyo, Japan). The SmartLab XRD was equipped with a Cu anode operating at 3 kW generating Cu KĮ radiation. Measurements were taken with Bragg–Brentano Optics and a D/Tex Detector for 2-Theta measurements from 15° to 40°.

Contact angle measurements were performed using a VCA Optima by AST Products, Inc. (Billerica, MA, USA) employing the sessile drop technique. Triple-distilled water was employed as a probe liquid, of which at least three replicate measurements were made for each sample. 3D laser confocal microscopy was performed on an Olympus LEXT 3D measuring laser microscope OLS4000. Surface roughness measurements were performed employing an 80 μm cutoff wavelength (Ȝc).
