Materials, Volume 17, Issue 7
2024 April-1 - 259 articles
Cover Story: Sufficient and non-invasive characterization of graphene/silicon interfaces is essential for the practical deployment of graphene-based electronic devices. Terahertz emission spectroscopy and microscopy (TES/LTEM) have emerged as promising techniques for probing the dynamic electronic properties of graphene and enabling extensive graphene mapping on a large scale. By employing ultra-fast femtosecond laser pulses, generated photoelectrons are accelerated by the interface electric field between the graphene and silicon substrate, resulting in THz emission that carries valuable information about the local graphene properties. View this paper - Issues are regarded as officially published after their release is announced to the table of contents alert mailing list .
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