Atomic Force Microscopy in Polymer Science

Dear Colleagues,

Atomic force microscopy (AFM) is a powerful technique for imaging and obtaining local surface properties information of surfaces at the nanometre-scale. This is achieved using a small tip, which can be coated or chemically/biologically derivatised, mounted on a cantilever to enable detection of tip-sample interactions. Since the early 1990s, AFM has continued to expand and evolve in terms of new application areas and technique development. The latter approach recently includes combining AFM with spectroscopic techniques, producing, for example, SEM-AFM, 3D tomographic AFM, AFM-ToF-SIMS, AFM-Raman, AFM-Confocal Raman Microscopy, AFM-NanoIR, and AFM-UV systems, among others.

This Special Issue is concerned with the application of AFM, whether using contact mode imaging with silicon nitride probes or more elaborate hybrid techniques with derivatised tips, to examine polymeric materials. We do not wish to limit the scope of polymers investigated, whether natural or synthetic, biological or industrial, but we seek to highlight the application of AFM as a principal technique in the publication. Both original contributions and reviews are welcome.

Dr. James R. Smith
Dr. Dimitrios A. Lamprou
Guest Editors

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