Prof. Dr. Wendong Zhang is a Deputy Director and
Professor at the State Key Laboratory of Dynamic Testing Technology,
North University of China. He
received a PhD at the Beijing Institute of Technology in 1995. After obtaining
the Ph.D. degree, he entered the Tsinghua University for Postdoctoral research.
In 1999, he went to UC Berkeley Institute of Technology, Berkeley Sensor and Actuator
Research Center in 1999, the National Laboratory of Metrology in Japan in 2001
and MIT in 2010, as Senior Visiting Scholar. He has been awarded the
title of “Outstanding Young and Middle-aged Expert with National Contributions”,
the “5th China Youth Science and Technology Award” chapter, the “National May
Day Labor Award” chapter and so on. In addition, he has presided over and
completed more than 40 scientific research projects, including 973, National
863, and National Natural Science Foundation of China key projects. Received 3-second
prizes for national scientific and technological inventions and 1-second prize
for national scientific and technological progress. At present, 102 academic
papers have been published, 4 authorized national invention patents. His
research direction is dynamic testing technology and intelligent instruments,
microelectromechanical systems (MEMS), etc.
