Tsuriel Avraham holds a B.Sc. degree in Electronic Engineering from Ben-Gurion University as well as an M.Sc. degree in Electronic Engineering from Ariel University. He is currently pursuing a Ph.D. at Ariel University in the Microelectronics Lab within the Department of Electrical Engineering, under the guidance of Prof. J.B. Bernstein. His research focuses on the reliability and failure analysis of GaN HEMT devices. Before starting his doctoral studies, he worked as a research assistant on several academic projects, where he developed a strong interest in finding new solutions in electronics and microfabrication.
Professor Bernstein’s expertise lies in several areas of micro-electronic devices, packaging, and system reliability, including failure analysis, process variations, and reliability prediction. He is a world-recognized expert in Microelectronics Devices, GaN, and SiC power device reliability and on advanced electronic packaging. He is a member of the Standards Institutions of Israel (SII), and he has worked directly with companies producing DRAM and SDRAM, SRAM and Flash memory, programmable gate arrays, and on reliability prediction and evaluation. He directs the Laboratory for Failure Analysis and Reliability of Electronic Systems, teaches VLSI design courses, and heads the VLSI program at Ariel University. His research areas include thermal, mechanical, and electrical interactions of failure mechanisms of ultra-thin gate dielectrics; non-volatile memory; advanced metallization; and power devices. He also works extensively with the semiconductor industry on projects relating to failure analysis, defect avoidance, and degradation in microelectronic circuits and packaging. Professor Bernstein was a Fulbright Senior Researcher/Lecturer at Tel Aviv University in the Department of Electrical Engineering, Honored lecturer at “Nanorun,” and at IEEE Summer-School in Toulouse, France. Professor Bernstein is a senior member of IEEE.
