Prof. Dr. Hongxia Liu received a B.S. degree in Microelectronics from North West University, Xi’an, China, in 1990, an M.S. degree in Microelectronics from Xi’an Jiaotong University, Xi’an, in 1995, and a Ph.D. degree in Microelectronics from Xidian University, Xi’an, in 2002. She has been a professor of Microelectronics at Xidian University since 2002. She was a senior visiting professor at Vanderbilt University (2011) and the University of Florida (2015). She has served as chair of several international conferences and program committees. Her current research interests include advanced CMOS device designs and reliability.
Prof. Dr. Shupeng Chen is an associate professor/graduate supervisor of the School of Microelectronics, Xidian University. His main research areas include semiconductor device reliability, integrated circuit reliability design, new low-power nanodevices, ultra-low-power integrated circuit design, etc. He received a bachelor's degree in Microelectronics from Xidian University in 2010, a master's degree in Microelectronics and Solid State Electronics in 2013, a Doctor's degree in Electronic Science and Technology from Xidian University in 2017, and a one-year academic visit to Professor Jamal Deen's
research group at McMaster University in 2019. He presided over several projects such as the National Natural Science Foundation Youth Fund, China Postdoctoral Fund, Shaanxi Province Science and Technology and Planning projects, 24 key laboratory fund projects, participated in several pre-research projects and key R&D projects during the "12th Five-Year Plan" to "13th Five-Year Plan", and basic strengthening program projects. The key funds of the National Natural Science Foundation and many other related scientific research work on integrated circuit reliability have rich scientific research experience and solid theoretical foundations in associated fields. IEEE Transactions on Electron Devices, IEEE Sensors Journal, Nanotechnology, Microelectronics Journal, Microelectronics Reliability, and many other international high-level journal consultants and reviewers.
