Chang Liu was born in Shandong, China, in 1992. He received the B. S. and M. S. degrees in microelectronics from Xidian University, Xi’an, China, in 2015 and 2018, respectively.
In 2018, he joined the Key Laboratory of Science and Technology on Reliability Physics and Application of Electronic Component, the Fifth Electronics Research Institute of the Ministry of Industry and Information Technology., Guangzhou, China. His current research interest includes GaN based high-electron-mobility transistors’ reliability.
Xianghong Hu graduated from Beihang University, South China University of Technology and Hefei University of Technology (China) with bachelor's, master's and doctor's degrees respectively.He is currently a researcher at the Fifth Electronics Research Institute of the Ministry of Industry and Information. His main research interests are environmental testing and reliability of electronic products.
