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Journal: Eng. Proc., 2024
Volume: 82
Number: 45
Article:
Detection of Peak Intensity Using an Integrated Optical Modeling Method for Identifying Defective Apple Leaves
Authors:
by
Nipun Shantha Kahatapitiya, Deshan Kalupahana, Hana Mohamed, Bhagya Nathali Silva, Udaya Wijenayake, Sangyeob Han, Daewoon Seong, Mansik Jeon, Jeehyun Kim and Ruchire Eranga Wijesinghe
Link:
https://www.mdpi.com/2673-4591/82/1/45
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