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Journal: J. Compos. Sci., 2024
Volume: 8
Number: 487
487
Article: Analysis of Oxide Capacitance Changes Based on the Formation–Annihilation of Conductive Filaments in a SiO₂/Si-NCs/SiO₂ Stack Layer-Based MIS-like Capacitor
Authors: by J. Miguel Germán-Martínez, K. E. González-Flores, B. Palacios-Márquez, C. Mendoza-Ramírez, M. Moreno, L. Hernández-Martínez and A. Morales-Sánchez
Link: https://www.mdpi.com/2504-477X/8/12/487

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