Caruso, R.; Camino, F.; Gu, G.; Tranquada, J.M.; Han, M.-G.; Zhu, Y.; Bollinger, A.T.; Božović, I.
Effects of Focused Ion Beam Lithography on La2−xSrxCuO4 Single Crystals. Condens. Matter 2023, 8, 35.
https://doi.org/10.3390/condmat8020035
AMA Style
Caruso R, Camino F, Gu G, Tranquada JM, Han M-G, Zhu Y, Bollinger AT, Božović I.
Effects of Focused Ion Beam Lithography on La2−xSrxCuO4 Single Crystals. Condensed Matter. 2023; 8(2):35.
https://doi.org/10.3390/condmat8020035
Chicago/Turabian Style
Caruso, Roberta, Fernando Camino, Genda Gu, John M. Tranquada, Myung-Geun Han, Yimei Zhu, Anthony T. Bollinger, and Ivan Božović.
2023. "Effects of Focused Ion Beam Lithography on La2−xSrxCuO4 Single Crystals" Condensed Matter 8, no. 2: 35.
https://doi.org/10.3390/condmat8020035
APA Style
Caruso, R., Camino, F., Gu, G., Tranquada, J. M., Han, M.-G., Zhu, Y., Bollinger, A. T., & Božović, I.
(2023). Effects of Focused Ion Beam Lithography on La2−xSrxCuO4 Single Crystals. Condensed Matter, 8(2), 35.
https://doi.org/10.3390/condmat8020035