A Systematic Qualification of a Planar-Type Phased Array Antenna with Cavity-Backed Slot Radiators for Communication Satellites Under Launch and On-Orbit Conditions
Abstract
1. Introduction
2. Overview of Ka-Band LEO Communication Satellite
3. Qualification of Manual Soldering in Reduced Module of Transmitting/Receiving Antenna Assembly
3.1. Environment Test of the Reduced Model Considering the Strucutral and Thermal Conditions
3.2. Evaluation of Function and Performance of the Reduced Model of Transmitting and Receiving Antennas Assembly
4. Assembly and Integration of the Antenna and RF Assemblies
5. Qualification of Transmitting/Receiving Antenna Assembly
5.1. Vibration Test Considering Quasi-Static, Sinusoidal and Random Vibrational Load During the Launch Process
- Whether the load delivered to the payload satisfies the test specification.
- Whether there were any structural changes in the prototype after each test.
- Whether there were any functional changes in the prototype after each test.
5.2. Thermal Vacuum Test of the Transmitting Aantenna (TA) and Receiving Antenna (RA) Assemblies
5.3. Shock Test of the Transmitting Antenna (TA) and Receiving Antenna (RA) Assemblies
- Whether the impact test was performed with a load appropriate to the test specifications.
- Whether the function/performance of the transmitting/receiving antenna section is normally implemented after the impact test.
6. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
Abbreviations
| TA | Transmitting antenna |
| RA | Receiving antenna |
| LLRVT | Low level random vibration test |
| TVac | Thermal-vacuum test |
| TRM | Transmitting reduced model |
| RRM | Receiving reduced model |
| LEO | Low earth orbit |
| ISL | Inter-satellite link |
| FRF | Frequency response function |
| CTE | Coefficient of thermal expansion |
| IMC | Inter-metallic compound |
| TC | Thermal cycling test |
| PRL | Passive return loss |
| VI | Visual inspection |
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| Test | Direction | Frequency [Hz] | Value | Remarks |
|---|---|---|---|---|
| Sine vibration test | All directions | 25~100 | 25 g | Sweep rate: 1 octave/min |
| 100~200 | 15 g | |||
| Random vibration test | Parallel to PCB | 20~100 | +6 dB/octave | Overall 27.1 g Duration: 5 min |
| 100~800 | 0.5 g2/Hz | |||
| 800~2000 | −3 dB/octave | |||
| Perpendicular to PCB | 20~100 | +6 dB/octave | Overall 28.5 g Duration: 5 min | |
| 100~500 | 1.0 g2/Hz | |||
| 500~2000 | −6 dB/octave | |||
| Low-level random vibration test | All directions | 5~2000 | 0.0005 g2/Hz | Overall 1 g Duration 1 min |
| Shock test | All direction | 100~550 | 40 g | 1 time for each direction |
| 550~4000 | 200 g | |||
| Thermal cycle test | - | - | −55~100 °C | Dwell time: 15 min 500 cycles |
| Test | Direction | Frequency [Hz] | Value | |
|---|---|---|---|---|
| Frequency requirement | All directions | - | ≥150 Hz | |
| Sine burst test | TA | All directions | 20 Hz | ≈30 g |
| RA | All directions | 20 Hz | ≈30 g | |
| Sine vibration test | TA/RA | All directions | 25~100 | 20 g |
| 100~200 | 6 g | |||
| Random vibration test | TA | Horizontal | 20~100 | +6 dB/octave |
| 100~300 | 00 g2/Hz | |||
| 300~2000 | −3 dB/octave | |||
| Overall | ≤10 rms | |||
| Vertical | 20~100 | +6 dB/octave | ||
| 100~300 | 00 g2/Hz | |||
| 300~2000 | −3 dB/octave | |||
| Overall | ≥10 g | |||
| RA | Horizontal | 20~100 | +6 dB/octave | |
| 100~300 | 00 g2/Hz | |||
| 300~2000 | −3 dB/octave | |||
| Overall | ≤10 rms | |||
| Vertical | 20~100 | +6 dB/octave | ||
| 100~300 | 00 g2/Hz | |||
| 300~2000 | −3 dB/octave | |||
| Overall | ≥10 g | |||
| Low-level random vibration test | TA/RA | All directions | 5~2000 | 0.5 g (Uniformly distributed) |
| Shock test | TA/RA | All directions | ~8000 Hz | Max 350 g |
| Thermal vacuum test | TA/RA | - | - | −00 ~ +00 °C |
| DUT | Test | Direction | Frequency [Hz] (Before/After) | Amplitude (Before/After) | F-Shift [%] | A-Shift [%] | Results |
|---|---|---|---|---|---|---|---|
| TA | Sine burst | X | 849/849 | 19.46/19.32 | 0.00 | 0.72 | PASS |
| Y | 538/539 | 25.54/25.21 | 0.19 | 1.31 | PASS | ||
| Z | 616/612 | 14.01/15.31 | 0.65 | 8.49 | PASS | ||
| Sine vibration | X | 848/850 | 19.71/18.68 | 0.24 | 2.62 | PASS | |
| Y | 539/539 | 25.04/24.78 | 0.00 | 1.05 | PASS | ||
| Z | 512/511 | 16.31/15.86 | 0.16 | 3.47 | PASS | ||
| Random vibration | X | 846/847 | 20.97/19.88 | 0.12 | 5.48 | PASS | |
| Y | 534/533 | 26.29/26.77 | 0.19 | 1.79 | PASS | ||
| Z | 603/603 | 12.60/1.78 | 0.00 | 6.96 | PASS | ||
| RA | Sine burst | X | 795/796 | 17.79/17.59 | 0.13 | 1.12 | PASS |
| Y | 552/550 | 20.08/19.94 | 0.36 | 0.70 | PASS | ||
| Z | 603/603 | 32.44/31.22 | 0.00 | 0.76 | PASS | ||
| Sine vibration | X | 795/795 | 17.65/17.67 | 0.00 | 0.11 | PASS | |
| Y | 551/551 | 20.06/19.64 | 0.00 | 2.09 | PASS | ||
| Z | 603/603 | 30.97/30.54 | 0.00 | 1.39 | PASS | ||
| Random vibration | X | 796/796 | 16.27/15.98 | 0.00 | 1.78 | PASS | |
| Y | 547/546 | 19.73/19.86 | 0.18 | 0.66 | PASS | ||
| Z | 600/597 | 24.68/22.04 | 0.50 | 10.70 | PASS |
| DUT | Function Test | Vibration Test | Thermal Test | Shock Test | |||
|---|---|---|---|---|---|---|---|
| Before | After | Before | After | Before | After | ||
| TAA | Power input | PASS | PASS | PASS | PASS | PASS | PASS |
| RS-422 | PASS | PASS | PASS | PASS | PASS | PASS | |
| FPGA | PASS | PASS | PASS | PASS | PASS | PASS | |
| PROM | PASS | PASS | PASS | PASS | PASS | PASS | |
| TCM Temp. | PASS | PASS | PASS | PASS | PASS | PASS | |
| TRF Temp. | PASS | PASS | PASS | PASS | PASS | PASS | |
| UCM Temp. | PASS | PASS | PASS | PASS | PASS | PASS | |
| TRSA Temp. | PASS | PASS | PASS | PASS | PASS | PASS | |
| TRSA PLL | PASS | PASS | PASS | PASS | PASS | PASS | |
| RAA | Power input | PASS | PASS | PASS | PASS | PASS | PASS |
| RS-422 | PASS | PASS | PASS | PASS | PASS | PASS | |
| FPGA | PASS | PASS | PASS | PASS | PASS | PASS | |
| PROM | PASS | PASS | PASS | PASS | PASS | PASS | |
| RCM Temp. | PASS | PASS | PASS | PASS | PASS | PASS | |
| RRF Temp. | PASS | PASS | PASS | PASS | PASS | PASS | |
| DCM Temp. | PASS | PASS | PASS | PASS | PASS | PASS | |
| RRSA Temp. | PASS | PASS | PASS | PASS | PASS | PASS | |
| RRSA PLL | PASS | PASS | PASS | PASS | PASS | PASS | |
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Share and Cite
Kim, H.-G.; Bak, J.; Lee, S.-J.; Jung, E.-T.; Choi, W.-S.; Yu, B.-G.; Choi, J.; Cho, J.-I.; Lee, W.-S.; Park, I.; et al. A Systematic Qualification of a Planar-Type Phased Array Antenna with Cavity-Backed Slot Radiators for Communication Satellites Under Launch and On-Orbit Conditions. Aerospace 2026, 13, 456. https://doi.org/10.3390/aerospace13050456
Kim H-G, Bak J, Lee S-J, Jung E-T, Choi W-S, Yu B-G, Choi J, Cho J-I, Lee W-S, Park I, et al. A Systematic Qualification of a Planar-Type Phased Array Antenna with Cavity-Backed Slot Radiators for Communication Satellites Under Launch and On-Orbit Conditions. Aerospace. 2026; 13(5):456. https://doi.org/10.3390/aerospace13050456
Chicago/Turabian StyleKim, Hyun-Guk, Jiye Bak, Seong-Ju Lee, Eun-Tae Jung, Woon-Sung Choi, Byeong-Gil Yu, Jaekark Choi, Jung-Il Cho, Won-Seok Lee, Insung Park, and et al. 2026. "A Systematic Qualification of a Planar-Type Phased Array Antenna with Cavity-Backed Slot Radiators for Communication Satellites Under Launch and On-Orbit Conditions" Aerospace 13, no. 5: 456. https://doi.org/10.3390/aerospace13050456
APA StyleKim, H.-G., Bak, J., Lee, S.-J., Jung, E.-T., Choi, W.-S., Yu, B.-G., Choi, J., Cho, J.-I., Lee, W.-S., Park, I., Min, H., Koh, H., Lee, M., Cho, J.-H., Kim, B., Park, K. Y., Hwang, K., & Kim, K. C. (2026). A Systematic Qualification of a Planar-Type Phased Array Antenna with Cavity-Backed Slot Radiators for Communication Satellites Under Launch and On-Orbit Conditions. Aerospace, 13(5), 456. https://doi.org/10.3390/aerospace13050456

