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Journal: Electronics, 2026
Volume: 15
Number: 659
Article:
Benchmarking LLM-as-a-Judge Models for 5W1H Extraction Evaluation
Authors:
by
José Cassola-Bacallao, José Morales-Donaire, Paula Hernández-Montoya and Brian Keith-Norambuena
Link:
https://www.mdpi.com/2079-9292/15/3/659
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