Li, W.; Guo, G.; Chen, Q.; Zhang, Z.; Zhao, S.; Liu, J.; Qin, F.
Experimental Study of the Comparison of the Synergistic Effect of Total Ionizing Dose and Neutron Single Event on Si/SiC MOSFETs. Electronics 2025, 14, 763.
https://doi.org/10.3390/electronics14040763
AMA Style
Li W, Guo G, Chen Q, Zhang Z, Zhao S, Liu J, Qin F.
Experimental Study of the Comparison of the Synergistic Effect of Total Ionizing Dose and Neutron Single Event on Si/SiC MOSFETs. Electronics. 2025; 14(4):763.
https://doi.org/10.3390/electronics14040763
Chicago/Turabian Style
Li, Wangtian, Gang Guo, Qiming Chen, Zheng Zhang, Shuyong Zhao, Jiancheng Liu, and Fengdi Qin.
2025. "Experimental Study of the Comparison of the Synergistic Effect of Total Ionizing Dose and Neutron Single Event on Si/SiC MOSFETs" Electronics 14, no. 4: 763.
https://doi.org/10.3390/electronics14040763
APA Style
Li, W., Guo, G., Chen, Q., Zhang, Z., Zhao, S., Liu, J., & Qin, F.
(2025). Experimental Study of the Comparison of the Synergistic Effect of Total Ionizing Dose and Neutron Single Event on Si/SiC MOSFETs. Electronics, 14(4), 763.
https://doi.org/10.3390/electronics14040763
