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Journal: J. Low Power Electron. Appl., 2012
Volume: 2
Number: 168
Article:
Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation
Authors:
by
Ameet Chavan, Praveen Palakurthi, Eric MacDonald, Joseph Neff and Eric Bozeman
Link:
https://www.mdpi.com/2079-9268/2/2/168
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