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Journal: Coatings, 2026
Volume: 16
Number: 597
Article:
Reliability Study and Lifetime Prediction of 270 nm AlGaN-Based Deep Ultraviolet Light-Emitting Diodes
Authors:
by
Shize Xu, Mingfeng Gong, Xuejiao Sun, Tong Zhang, Ting Liang, Naixin Liu and Jinmin Li
Link:
https://www.mdpi.com/2079-6412/16/5/597
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